Research Catalog

Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

Title
Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
Author
Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City, N.J.)
Publication
Philadelphia : American Society for Testing and Materials, [1964]

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Details

Additional Authors
  • ASTM Committee E-2 on Emission Spectroscopy.
  • American Society for Testing and Materials. Committee E-4 on Metallography.
Description
vi, 209 pages : illustrations; 24 cm.
Series Statement
ASTM special technical publication ; no. 349
Uniform Title
ASTM special technical publication ; 349.
Subject
  • X-ray spectroscopy > Congresses
  • Probes (Electronic instruments) > Congresses
Note
  • Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography.
Bibliography (note)
  • Includes bibliographies.
LCCN
63021661
OCLC
  • ocm02171048
  • SCSB-3910944
Owning Institutions
Columbia University Libraries