Research Catalog

Defect analysis in electron microscopy

Title
Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.
Author
Loretto, M. H.
Publication
London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, [1975], ©1975.

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Details

Additional Authors
Smallman, R. E.
Description
ix, 134 pages : illustrations; 24 cm
Subjects
Note
  • "A Halsted Press book."
  • Includes index.
Bibliography (note)
  • Bibliography: p. 131.
ISBN
  • 0412137607
  • 0412137704 (pbk.)
LCCN
75025615
OCLC
  • ocm01582682
  • SCSB-3911753
Owning Institutions
Columbia University Libraries