Research Catalog

A BASIC program for calculating dopant density profiles from capacitance-voltage data

Title
A BASIC program for calculating dopant density profiles from capacitance-voltage data / Richard L. Mattis and Martin G. Buehler.
Author
Mattis, Richard L.
Publication
Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.

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Details

Additional Authors
  • Buehler, Martin G.
  • United States. National Bureau of Standards.
Description
v, 33 pages : illustrations; 26 cm.
Series Statement
  • Semiconductor measurement technology
  • National Bureau of Standards special publication ; 400-11
Uniform Title
  • NBS special publication ; 400-11.
  • Semiconductor measurement technology.
Subject
  • Ion implantation > Data processing
  • Diodes, Semiconductor > Data processing
  • Electric measurements > Data processing
  • BASIC (Computer program language)
Bibliography (note)
  • Includes bibliographical references.
LCCN
75619089
OCLC
  • ocm01323497
  • SCSB-3926558
Owning Institutions
Columbia University Libraries