Research Catalog
Semiconductor reliability.
- Title
- Semiconductor reliability.
- Publication
- Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York, [1961-62]
Items in the Library & Off-site
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2 Items
| Status | Vol/Date | Format | Access | Call Number | Item Location |
|---|---|---|---|---|---|
| v.1 | Text | Request in advance | TK7872.S4 Se52 v.1 | Off-site | |
| v.2 | Text | Request in advance | TK7872.S4 Se52 v.2 | Off-site |
Holdings
Details
- Additional Authors
- Shwop, John E.
- Von Alven, William H.
- United States. Advisory Group on Electron Tubes.
- Aerospace Industries Association of America.
- Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.)
- Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.)
- Description
- 2 volumes : illustrations, diagrams, tables; 24 cm
- Subject
- Note
- Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
- Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
- Bibliography (note)
- Includes bibliographies.
- LCCN
- 61012685
- OCLC
- ocm02834840
- SCSB-3926743
- Owning Institutions
- Columbia University Libraries