Research Catalog

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Title
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
Author
Bushnell, Michael L. (Michael Lee), 1950-
Publication
Boston : Kluwer Academic, [2000], ©2000.

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Details

Additional Authors
Agrawal, Vishwani D., 1943-
Description
xviii, 690 pages : illustrations; 26 cm.
Series Statement
Frontiers in electronic testing
Uniform Title
Frontiers in electronic testing.
Subject
  • Integrated circuits > Testing
  • Digital integrated circuits > Testing
  • Mixed signal circuits > Testing
  • Semiconductor storage devices > Testing
Bibliography (note)
  • Includes bibliographical references (p. [631]-670) and index.
ISBN
0792379918 (alk. paper)
LCCN
00046212
OCLC
  • ocm44926977
  • SCSB-4074407
Owning Institutions
Columbia University Libraries