Research Catalog
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
- Title
- Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
- Author
- Bushnell, Michael L. (Michael Lee), 1950-
- Publication
- Boston : Kluwer Academic, [2000], ©2000.
Items in the Library & Off-site
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TK7874.75 .B87 2000 | Off-site |
Holdings
Details
- Additional Authors
- Agrawal, Vishwani D., 1943-
- Description
- xviii, 690 pages : illustrations; 26 cm.
- Series Statement
- Frontiers in electronic testing
- Uniform Title
- Frontiers in electronic testing.
- Subject
- Bibliography (note)
- Includes bibliographical references (p. [631]-670) and index.
- ISBN
- 0792379918 (alk. paper)
- LCCN
- 00046212
- OCLC
- ocm44926977
- SCSB-4074407
- Owning Institutions
- Columbia University Libraries