Research Catalog

IEEE Autotestcon proceedings.

Title: IEEE Autotestcon proceedings.
Author: Autotestcon.
Publication: [New York, N.Y.] : Institute of Electrical and Electronics Engineers, ©1997-

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Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	2003	Text	Request in advance	TJ213 .A8411 2003	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	2002	Text	Request in advance	TJ213 .A8411 2002	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	2001	Text	Request in advance	TJ213 .A8411 2001	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	2000	Text	Request in advance	TJ213 .A8411 2000	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1999	Text	Request in advance	TJ213 .A8411 1999	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1998	Text	Request in advance	TJ213 .A8411 1998	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1997	Text	Request in advance	TJ213 .A8411 1997	Off-site

Additional Authors

Publication Date

1997-

Description

volumes : illustrations; 28 cm

Alternative Title

IEEE Autotestcon

Subjects

Note

Issued By (note)

Sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, and the IEEE Los Angeles Council.

ISSN

LCCN

sn 98046809

OCLC

Owning Institutions

Columbia University Libraries