Research Catalog

2000 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000

Title
2000 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Author
International Integrated Reliability Workshop (2000 : Lake Tahoe, Calif.)
Publication
Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, [2000], ©2000.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance TK7874 .I4735 2000gOff-site

Details

Additional Authors
  • IEEE Electron Devices Society.
  • IEEE Reliability Society.
Description
vii, 199 pages : illustrations; 28 cm
Alternative Title
  • 2000 IRW final report
  • IEEE International Integrated Reliability Workshop final report
Subjects
Note
  • "IEEE Catalog No. 00TH8515."
Bibliography (note)
  • Includes bibliographical references.
ISBN
0780363922 (pbk.)
LCCN
00002863
OCLC
  • ocm45913793
  • SCSB-4075999
Owning Institutions
Columbia University Libraries