Research Catalog
Proceedings
- Title
- Proceedings / International Test Conference.
- Author
- International Test Conference.
- Publication
- Silver Spring, Md. : IEEE Computer Society Press, 1983-
Items in the Library & Off-site
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Search by Year
26 Items
Status | Vol/Date | Format | Access | Call Number | Item Location |
---|---|---|---|---|---|
2003 | Text | Request in advance | TK7874 .I6 2003 | Off-site | |
2003 | Text | Request in advance | TK7874 .I6 2003 | Off-site | |
2002 | Text | Request in advance | TK7874 .I6 2002 | Off-site | |
2001 | Text | Request in advance | TK7874 .I6 2001 | Off-site | |
2000 | Text | Request in advance | TK7874 .I6 2000 | Off-site | |
1999 | Text | Request in advance | TK7874 .I6 1999 | Off-site | |
1998 | Text | Request in advance | TK7874 .I6 1998 | Off-site | |
1997 | Text | Request in advance | TK7874 .I6 1997 | Off-site | |
1997 | Text | Request in advance | TK7874 .I6 1997 | Off-site | |
1996 | Text | Request in advance | TK7874 .I6 1996 | Off-site | |
1996 | Text | Request in advance | TK7874 .I6 1996 | Off-site | |
1995 | Text | Request in advance | TK7874 .I6 1995 | Off-site | |
1995 | Text | Request in advance | TK7874 .I6 1995 | Off-site | |
1994 | Text | Request in advance | TK7874 .I6 1994 | Off-site | |
1994 | Text | Request in advance | TK7874 .I6 1994 | Off-site | |
1993 | Text | Request in advance | TK7874 .I6 1993 | Off-site | |
1992 | Text | Request in advance | TK7874 .I6 1992 | Off-site | |
1991 | Text | Request in advance | TK7874 .I6 1991 | Off-site | |
1990 | Text | Request in advance | TK7874 .I6 1990 | Off-site | |
1989 | Text | Request in advance | TK7874 .I6 1989 | Off-site |
Holdings
Details
- Additional Authors
- Publication Date
- 1983-
- Description
- volumes : illustrations; 28 cm
- Alternative Title
- IEEE...Test Conference
- Proceedings International Test Conference
- International Test Conference proceedings
- Subjects
- Note
- Each conference has also a distinctive title.
- Issued By (note)
- Conferences for 1983-1984 sponsored by the IEEE Computer Society, Test Technology Committee and the IEEE Philadelphia Section.
- ISSN
- 1089-3539
- OCLC
- 10342268
- ocm10342268
- SCSB-2354230
- Owning Institutions
- Columbia University Libraries