Research Catalog

Proceedings

Title
Proceedings / International Test Conference.
Author
International Test Conference.
Publication
Silver Spring, Md. : IEEE Computer Society Press, 1983-

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2003TextRequest in advance TK7874 .I6 2003Off-site
2003TextRequest in advance TK7874 .I6 2003Off-site
2002TextRequest in advance TK7874 .I6 2002Off-site
2001TextRequest in advance TK7874 .I6 2001Off-site
2000TextRequest in advance TK7874 .I6 2000Off-site
1999TextRequest in advance TK7874 .I6 1999Off-site
1998TextRequest in advance TK7874 .I6 1998Off-site
1997TextRequest in advance TK7874 .I6 1997Off-site
1997TextRequest in advance TK7874 .I6 1997Off-site
1996TextRequest in advance TK7874 .I6 1996Off-site
1996TextRequest in advance TK7874 .I6 1996Off-site
1995TextRequest in advance TK7874 .I6 1995Off-site
1995TextRequest in advance TK7874 .I6 1995Off-site
1994TextRequest in advance TK7874 .I6 1994Off-site
1994TextRequest in advance TK7874 .I6 1994Off-site
1993TextRequest in advance TK7874 .I6 1993Off-site
1992TextRequest in advance TK7874 .I6 1992Off-site
1991TextRequest in advance TK7874 .I6 1991Off-site
1990TextRequest in advance TK7874 .I6 1990Off-site
1989TextRequest in advance TK7874 .I6 1989Off-site

Holdings

Details

Additional Authors
  • IEEE Computer Society. Test Technology Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication Date
1983-
Description
volumes : illustrations; 28 cm
Alternative Title
  • IEEE...Test Conference
  • Proceedings International Test Conference
  • International Test Conference proceedings
Subjects
Note
  • Each conference has also a distinctive title.
Issued By (note)
  • Conferences for 1983-1984 sponsored by the IEEE Computer Society, Test Technology Committee and the IEEE Philadelphia Section.
ISSN
1089-3539
OCLC
  • 10342268
  • ocm10342268
  • SCSB-2354230
Owning Institutions
Columbia University Libraries