Research Catalog
Polarization analysis, measurement, and remote sensing III : 2-4 August, 2000, San Diego, USA
- Title
- Polarization analysis, measurement, and remote sensing III : 2-4 August, 2000, San Diego, USA / David B. Chenault [and others], chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering ; cooperating organization, the Remote Sensing Society.
- Publication
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
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Status | Format | Access | Call Number | Item Location |
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Text | Request in advance | QC443 .P653 2000g | Off-site |
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Details
- Additional Authors
- Description
- ix, 302 pages : illustrations; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 4133
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 4133.
- Alternative Title
- Polarization analysis and measurement.
- Subject
- Note
- Previous conferences entitled: Polarization analysis and measurement.
- Bibliography (note)
- Includes bibliographic references and index.
- ISBN
- 0819437786
- OCLC
- ocm45670019
- SCSB-4082531
- Owning Institutions
- Columbia University Libraries