Research Catalog

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

Title
Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [2001], ©2001.

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Additional Authors
  • Harding, Kevin G.
  • Miller, John W. V.
  • Batchelor, Bruce G.
  • Society of Photo-optical Instrumentation Engineers.
Description
vii, 296 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4189
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4189.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819438545
OCLC
  • ocm46727829
  • SCSB-4122581
Owning Institutions
Columbia University Libraries