Research Catalog
Materials, technology, and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A
- Title
- Materials, technology, and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A / editors, G.S. Oehrlein [and others].
- Publication
- Warrendale, Pa. : Materials Research Society, [2001], ©2001.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7871.85 .M36783 2001 | Off-site |
Holdings
Details
- Additional Authors
- Oehrlein, G. S.
- Description
- 1 volume (various pagings) : illustrations; 24 cm.
- Series Statement
- Materials Research Society symposium proceedings ; v. 612
- Uniform Title
- Materials Research Society symposia proceedings ; v. 612.
- Subjects
- Bibliography (note)
- Includes bibliographical references and indexes.
- ISBN
- 1558994270
- LCCN
- 00069552
- OCLC
- ocm45707698
- SCSB-4157458
- Owning Institutions
- Columbia University Libraries