Research Catalog
Proceedings : 2001 IEEE International Workshop on Memory Technology, Design and Testing : August 6-7, 2001, San Jose, California, USA
- Title
- Proceedings : 2001 IEEE International Workshop on Memory Technology, Design and Testing : August 6-7, 2001, San Jose, California, USA / editors, Yervant Zorian [and others] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Author
- IEEE International Workshop on Memory Technology, Design, and Testing (9th : 2001 : San Jose, Calif.)
- Publication
- Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
Items in the Library & Off-site
Filter by
1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7895.M4 I335 2001g | Off-site |
Holdings
Details
- Additional Authors
- Description
- viii, 108 pages : illustrations; 28 cm
- Alternative Title
- Memory technology, design and testing
- 2001 IEEE International Workshop on Memory Technology, Design and Testing
- IEEE International Workshop on Memory Technology, design and Testing
- International Workshop on Memory Techonology, Design and Testing
- Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000
- Subjects
- Note
- "IEEE Computer Society Order Number PR01242"--verso of T.p.
- "... the ninth in a series of annual workshops ..."--P. vii.
- Bibliography (note)
- Includes bibliographic references and author index.
- Additional Formats (note)
- Also available via the World Wide Web.
- ISBN
- 0769512429
- 0769512437 (case)
- 0769512445 (microfiche)
- OCLC
- 49326416
- ocm49326416
- SCSB-4174150
- Owning Institutions
- Columbia University Libraries