Research Catalog

Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland

Title
Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland / Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland).
Publication
Bellingham, Wash., USA : SPIE, [2001], ©2001.

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Details

Additional Authors
  • Pluta, Maksymilian.
  • Szyjer, Mariusz.
  • Powichrowska, Ewa.
  • Society of Photo-optical Instrumentation Engineers.
  • Society of Photo-optical Instrumentation Engineers. Poland Chapter.
  • Institute of Applied Optics (Poland)
  • Komitet Badań Naukowych (Poland)
Description
xxiii, 302 pages : illustrations; 28 cm.
Series Statement
  • SPIE Poland Chapter proceedings ; 58
  • SPIE proceedings series ; v. 4517
Uniform Title
  • Proceedings of SPIE--the International Society for Optical Engineering ; v. 4517.
  • SPIE Poland Chapter proceedings ; 58.
Alternative Title
Metrology, spectroscopy, and testing techniques using light
Subject
  • Light > Congresses
  • Polarization (Light) > Congresses
  • Optical measurements > Congresses
  • Optical detectors > Congresses
  • Measurement > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819442402
OCLC
  • ocm48157326
  • SCSB-4205216
Owning Institutions
Columbia University Libraries