Research Catalog
Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
- Title
- Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland / Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland).
- Publication
- Bellingham, Wash., USA : SPIE, [2001], ©2001.
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Status | Format | Access | Call Number | Item Location |
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Text | Request in advance | QC367 .L54 2001g | Off-site |
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Details
- Additional Authors
- Description
- xxiii, 302 pages : illustrations; 28 cm.
- Series Statement
- SPIE Poland Chapter proceedings ; 58
- SPIE proceedings series ; v. 4517
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 4517.
- SPIE Poland Chapter proceedings ; 58.
- Alternative Title
- Metrology, spectroscopy, and testing techniques using light
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0819442402
- OCLC
- ocm48157326
- SCSB-4205216
- Owning Institutions
- Columbia University Libraries