Research Catalog

2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 24-26 October, 2001, San Francisco, California

Title
2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 24-26 October, 2001, San Francisco, California / sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee.
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001 : San Francisco, Calif.)
Publication
Los Alamitos, California : IEEE Computer Society Press, [2001], ©2001.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance TK7874 .I177 2001gOff-site

Details

Additional Authors
  • IEEE Computer Society. Fault-Tolerant Computing Technical Committee.
  • IEEE Computer Society. Test Technology Technical Committee.
Description
xiii, 468 pages : illustrations; 23 cm
Alternative Title
  • International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Defect and fault tolerance in VLSI systems
  • DFT 2001
Subjects
Note
  • "DFT 2001"--half T.p.
  • "IEEE Computer Society Order Number PR01203"--verso of T.p.
Bibliography (note)
  • Includes bibliographic references and author index.
Additional Formats (note)
  • Also available via the World Wide Web.
ISBN
  • 0769512038
  • 0769512046 (case)
  • 0769512054 (microfiche)
OCLC
  • ocm48385984
  • SCSB-4206428
Owning Institutions
Columbia University Libraries