Research Catalog

Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA

Title
Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA / Émile J. Knystautas, Wiley P. Kirk, Valerie Browning, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [2001], ©2001.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance TA418.9.T45 E54 2001gOff-site

Holdings

Details

Additional Authors
  • Knystautas, Emile J.
  • Kirk, Wiley P.
  • Browning, Valerie M.
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 192 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4468
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4468.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819441821
OCLC
  • ocm49050273
  • SCSB-4257396
Owning Institutions
Columbia University Libraries