Research Catalog
Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August, 2001, San Diego, [California] USA
- Title
- Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August, 2001, San Diego, [California] USA / Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Publication
- Bellingham, Washington : SPIE, [2001], ©2001.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TA418.7 .O684 2001g | Off-site |
Holdings
Details
- Additional Authors
- Description
- ix, 294 pages : illustrations; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 4449
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 4449.
- Subjects
- Bibliography (note)
- Includes bibliographic references and author index.
- ISBN
- 0819441635
- OCLC
- ocm49011017
- SCSB-4257403
- Owning Institutions
- Columbia University Libraries