Research Catalog

Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA

Title
Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA / Olivier Delage, Eric Munro, John A. Rouse, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, [2001], ©2001.

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Details

Additional Authors
  • Delage, Olivier.
  • Munro, Eric.
  • Rouse, John A.
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 236 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4510
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4510.
Subjects
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819442240
OCLC
  • ocm49050617
  • SCSB-4257510
Owning Institutions
Columbia University Libraries