Research Catalog

Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October, 2001, Boston, [Massachusetts] USA

Title
Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October, 2001, Boston, [Massachusetts] USA / Kevin G. Harding, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Washington : SPIE, [2002], ©2002.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance TA1634 .M33 2002gOff-site

Holdings

Details

Additional Authors
  • Harding, Kevin G.
  • Miller, John W. V.
  • Society of Photo-optical Instrumentation Engineers.
Description
ix, 236 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4567
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4567.
Subjects
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
081944295X
OCLC
  • ocm49535329
  • SCSB-4269649
Owning Institutions
Columbia University Libraries