Research Catalog
Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
- Title
- Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Author
- IEEE International Workshop on Memory Technology, Design, and Testing (10th : 2002 : Isle of Bendor, France)
- Publication
- Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7895.M4 I335 2002g | Off-site |
Holdings
Details
- Additional Authors
- Description
- xii, 182 pages : illustrations; 28 cm
- Alternative Title
- MTDT 2002
- Subject
- Note
- "IEEE Computer Society Order Number PR01617"--verso of T.p.
- "... 10th anniversary of the Workshop ..."--P. x.
- Bibliography (note)
- Includes bibliographic references and author index.
- Additional Formats (note)
- Also available via the World Wide Web.
- ISBN
- 0769516173
- 0769516181 (bookbroker)
- 076951619X (microfiche)
- OCLC
- 50761453
- ocm50761453
- SCSB-4293596
- Owning Institutions
- Columbia University Libraries