Research Catalog

Optical system contamination : effects, measurements, and control VII : 9-11 July, 2002, Seattle, [Washington] USA

Title
Optical system contamination : effects, measurements, and control VII : 9-11 July, 2002, Seattle, [Washington] USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) [and others].
Publication
Bellingham, Washington : SPIE, [2002], ©2002.

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Additional Authors
  • Chen, Philip T.
  • Uy, O. Manuel.
  • Society of Photo-optical Instrumentation Engineers.
  • Boeing Company.
Description
vii, 282 pages : illustrations; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering ; v. 4774
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4774.
Subjects
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
081944541X
OCLC
  • ocm50750026
  • SCSB-4310766
Owning Institutions
Columbia University Libraries