Research Catalog

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9-13 September 2002, Novosibirsk, Russia

Title: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9-13 September 2002, Novosibirsk, Russia / Yuri V. Chugui [and others], chairs/editors ; co-organized by TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia) [and] ILP--Institute of Laser Physics (Russia) ; sponsored by SPIE--the International Society for Optical Engineering [and others] ; endorsed by IMEKO--International Measurement Confederation [and others] ; cooperating organizations, IAE--Institute of Automation and Electrometry (Russia) [and others].
Author: International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life (7th : 2002 : Novosibirsk, Russia)
Publication: Bellingham, Wash., USA : SPIE, [2002], ©2002.

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Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v.2	Text	Request in advance	TA1673 .I5824 2002g v.2	Off-site
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v.1	Text	Request in advance	TA1673 .I5824 2002g v.1	Off-site

Additional Authors

Description

2 volumes (xxiv, 1332 pages) : illustrations; 28 cm.

Series Statement

SPIE proceedings series, 0277-786X ; v. 4900

Uniform Title

Proceedings of SPIE--the International Society for Optical Engineering ; v. 4900.

Alternative Title

7th International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Laser metrology applied to science, industry, and everyday life

Subjects

Bibliography (note)

ISBN

0819446866

OCLC

Owning Institutions

Columbia University Libraries