Research Catalog

Polarization measurement, analysis, and applications V : 8-9 July, 2002, Seattle, [Washington] USA

Title
Polarization measurement, analysis, and applications V : 8-9 July, 2002, Seattle, [Washington] USA / Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA).
Publication
Bellingham, Washington : SPIE, [2002], ©2002.

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Details

Additional Authors
  • Goldstein, Dennis H.
  • Chenault, David B.
  • Society of Photo-optical Instrumentation Engineers.
  • Boeing Company.
Description
vii, 206 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4819
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4819.
Subjects
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
0819445878
OCLC
  • 506116985
  • ocn506116985
  • SCSB-4316671
Owning Institutions
Columbia University Libraries