Research Catalog

DFT 2002 : 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 6-8 November, 2002, Vancouver, BC, Canada

Title
DFT 2002 : 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 6-8 November, 2002, Vancouver, BC, Canada / [sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing].
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (17th : 2002 : Vancouver, B.C.)
Publication
Los Alamitos, California : IEEE Computer Society Press, [2002], ©2002.

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Details

Additional Authors
  • IEEE Computer Society. Fault-Tolerant Computing Technical Committee.
  • IEEE Computer Society. Test Technology Technical Committee.
Description
xiii, 441 pages : illustrations; 23 cm
Alternative Title
  • International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Defect and fault tolerance in VLSI systems
Subjects
Note
  • "IEEE Computer Society Order Number PR01831"--verso of T.p.
Bibliography (note)
  • Includes bibliographic references and author index.
Additional Formats (note)
  • Also available via the World Wide Web.
ISBN
0769518311
OCLC
  • ocm51026609
  • SCSB-4317856
Owning Institutions
Columbia University Libraries