Research Catalog

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July, 2002, Seattle, Washington, USA

Title
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July, 2002, Seattle, Washington, USA / Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by, SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) [and others].
Publication
Bellingham, Wash. : SPIE, [2002], ©2002.

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Details

Additional Authors
  • Duparré, Angela.
  • Singh, B. (Bhanwar)
  • Society of Photo-optical Instrumentation Engineers.
  • Boeing Company.
Description
viii, 192 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 4779
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4779.
Subjects
Bibliography (note)
  • Includes bibliographic references and author index.
ISBN
0819445460
OCLC
  • ocm51157395
  • SCSB-4322550
Owning Institutions
Columbia University Libraries