Research Catalog

The destructive bond pull test

Title
The destructive bond pull test / John Albers, editor ; Electronic Technology Division.
Author
Albers, John.
Publication
[Washington] : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.

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TextRequest in advance C 13.10:400-18Off-site

Details

Additional Authors
  • Institute for Applied Technology (U.S.). Electronic Technology Division.
  • United States. Defense Nuclear Agency.
  • United States. Navy Strategic Systems Projects Office.
Series Statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-18
Uniform Title
  • Semiconductor measurement technology.
  • NBS special publication ; 400-18.
Subject
Note
  • CODEN: XNBSAV
  • "Jointly supported by the National Bureau of Standards, the Defense Nuclear Agency, and the Navy Strategic Systems Project Office."
  • [$1.25, 13 cds]
Bibliography (note)
  • Includes bibliographical references.
LCCN
75619425
OCLC
  • ocm01992538
  • SCSB-4350380
Owning Institutions
Columbia University Libraries