Research Catalog
Accuracy in trace analysis : sampling, sample handling, analysis
- Title
- Accuracy in trace analysis : sampling, sample handling, analysis / Philip D. LaFleur, editor.
- Author
- Materials Research Symposium (7th : 1974 : Gaithersburg, Md.)
- Publication
- Washington : U.S. Department of Commerce, National Bureau of Standards, : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
Items in the Library & Off-site
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2 Items
Status | Vol/Date | Format | Access | Call Number | Item Location |
---|---|---|---|---|---|
v.1 | Text | Request in advance | C 13.10:422/v.1-2 v.1 | Off-site | |
v.2 | Text | Request in advance | C 13.10:422/v.1-2 v.2 | Off-site |
Holdings
Details
- Additional Authors
- Series Statement
- NBS special publication ; 422
- Uniform Title
- NBS special publication ; 422.
- Subjects
- Genre/Form
- Congress.
- Note
- CODEN: XNBSAV
- Bibliography (note)
- Includes bibliographies.
- LCCN
- 75619250
- OCLC
- ocm01583552
- SCSB-4350534
- Owning Institutions
- Columbia University Libraries