Research Catalog

Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

Title
Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney ; Electronic Technology Division.
Author
Kenney, James M.
Publication
Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.

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Holdings

Details

Additional Authors
  • Institute for Applied Technology (U.S.). Electronic Technology Division.
  • United States. Defense Nuclear Agency.
Series Statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-7
Uniform Title
  • Semiconductor measurement technology.
  • NBS special publication ; 400-7.
Subjects
Note
  • CODEN: XNBSAV
  • Activity supported in cooperation with the Defense Nuclear Agency.
LCCN
76005868
OCLC
  • ocm02539803
  • SCSB-4350618
Owning Institutions
Columbia University Libraries