Research Catalog
A reverse-bias safe operating area transistor tester
- Title
- A reverse-bias safe operating area transistor tester / David W. Berning, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Author
- Berning, David W.
- Publication
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | C 13.10:400-54 | Off-site |
Holdings
Details
- Additional Authors
- Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
- Series Statement
- Semiconductor measurement technology
- NBS special publication ; 400-54
- Uniform Title
- Semiconductor measurement technology.
- NBS special publication ; 400-54.
- Subject
- Note
- Issued Mar. 1979.
- CODEN: XNBSAV.
- Bibliography (note)
- Bibliography: p. 14.
- OCLC
- ocm04993132
- SCSB-4353436
- Owning Institutions
- Columbia University Libraries