Research Catalog

An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices

Title
An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices / David L. Blackburn, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
Author
Blackburn, David L.
Publication
Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.

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TextRequest in advance C 13.10:400-52Off-site

Holdings

Details

Additional Authors
  • Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
  • United States. Division of Electric Energy Systems.
Series Statement
  • NBS special publication ; 400-52
  • Semiconductor measurement technology
Uniform Title
  • NBS special publication ; 400-52.
  • Semiconductor measurement technology.
Subjects
Note
  • This activity was supported by the Dept. of Energy, Division of Electric Energy Systems.
  • Issued Nov. 1979.
  • CODEN:XNBSAV.
Bibliography (note)
  • Includes bibliographical references.
OCLC
  • ocm05782427
  • SCSB-4354257
Owning Institutions
Columbia University Libraries