Research Catalog

Thermal resistance measurements on power transistors

Title
Thermal resistance measurements on power transistors / Sherwin Rubin and Frank F. Oettinger, Electron Devices Division, Center for Electronics and Electrical Engineering, National Laboratory, National Bureau of Standards.
Author
Rubin, Sherwin.
Publication
Washington : Department of Commerce, National Bureau of Standards : for sale by Supt. of Docs., U.S. Govt. Print. Off., 1979.

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Holdings

Details

Additional Authors
  • Oettinger, Frank F.
  • Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
  • United States. National Bureau of Standards.
Series Statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-14
Uniform Title
  • Semiconductor measurement technology.
  • NBS special publication ; 400-14.
Subjects
Note
  • Issued Apr. 1979.
  • CODEN:XNBSAV
Bibliography (note)
  • Includes bibliographical references.
LCCN
79009984
OCLC
  • ocm04775408
  • SCSB-4355187
Owning Institutions
Columbia University Libraries