Research Catalog

Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures

Title
Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm ; sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.
Author
Mitchell, Michael A.
Publication
Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.

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Details

Additional Authors
  • Linholm, Loren W.
  • United States. National Bureau of Standards.
  • Air Force Wright Aeronautical Laboratories.
  • Center for Electronics and Electrical Engineering (U.S.)
Series Statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-65
Uniform Title
  • Semiconductor measurement technology.
  • NBS special publication ; 400-65.
Subjects
Note
  • "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
  • Issued March 1981."
Bibliography (note)
  • Includes bibliographical references.
LCCN
80600197
OCLC
  • ocm07664412
  • SCSB-4356368
Owning Institutions
Columbia University Libraries