Research Catalog

A manual wafer probe station for an integrated circuit test system

Title
A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
Author
Carver, G. P.
Publication
Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.

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Details

Additional Authors
  • Cullins, W. A.
  • United States. National Bureau of Standards.
  • Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
Series Statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-68
Uniform Title
  • Semiconductor measurement technology.
  • NBS special publication ; 400-68.
Subject
  • Probes (Electronic instruments)
  • Integrated circuits > Testing
Note
  • "Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
  • "Issued May 1981."
Bibliography (note)
  • Includes bibliographical references.
LCCN
81600033
OCLC
  • ocm07695149
  • SCSB-4356370
Owning Institutions
Columbia University Libraries