Research Catalog
National Semiconductor Metrology Program : [catalog]
- Title
- National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].
- Author
- National Semiconductor Metrology Program (U.S.)
- Publication
- Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
Items in the Library & Off-site
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6 Items
Status | Vol/Date | Format | Access | Call Number | Item Location |
---|---|---|---|---|---|
2000 | Text | Request in advance | C 13.37:103/ 2000 | Off-site | |
1999 | Text | Request in advance | C 13.37:103/ 1999 | Off-site | |
1998 | Text | Request in advance | C 13.37:103/ 1998 | Off-site | |
1997 | Text | Request in advance | C 13.37:103/ 1997 | Off-site | |
1996 | Text | Request in advance | C 13.37:103/ 1996 | Off-site | |
Not available - Please for assistance. | Text | Use in library | Off-site |
Holdings
Details
- Additional Authors
- Publication Date
- Mar. 1995-
- Description
- volumes; 28 cm.
- Series Statement
- NIST list of publications ; LP 103
- Uniform Title
- NIST list of publications ; 103.
- Alternative Title
- National Semiconductor Metrology Program and Semiconductor Electronics Division publications.
- Subjects
- Note
- Address: National Technical Information Service, U.S. Dept. of Commerce, Attn: NTIS Order Clerk, Springfield, VA 22161.
- Title from cover.
- Numbering (note)
- Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).
- Additional Formats (note)
- Titles for the latest year (not cumulative) also available via Internet from the EEEL web site. Address as of 9/8/00: http://www.eeel.nist.gov/810.01/; current access is available via PURL.
- LCCN
- sn 95027357
- OCLC
- ocm32519278
- SCSB-4370326
- Owning Institutions
- Columbia University Libraries