Research Catalog

Quantitative layer-by-layer perimetry : an extended analysis / Jay M. Enoch, C.R. Fitzgerald, E.C. Campos ; with a foreword by Hans Goldman.

Title
Quantitative layer-by-layer perimetry : an extended analysis / Jay M. Enoch, C.R. Fitzgerald, E.C. Campos ; with a foreword by Hans Goldman.
Author
Enoch, Jay M.

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TextUse in library RE79.P4 En6 1981Off-site

Details

Additional Authors
  • Campos, E. C. (Emilio C.)
  • Fitzgerald, C. R. (Constance Ramsey)
Description
xii, 232 p. : ill.; 24 cm.
Series Statement
Current ophthalmology monographs
Subject
  • Perimetry
  • Visual Field Tests
  • Visual Fields
ISBN
0808912828
LCCN
80023156
Owning Institutions
Columbia University Libraries