Research Catalog

Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.

Title
Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
Author
Siegel, Benjamin M., 1916-
Publication
New York : Wiley, [1975]

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Details

Additional Authors
  • Beaman, Donald Robert,
  • Electron Microscopy Society of America. http://id.loc.gov/authorities/names/n50055810
  • Microbeam Analysis Society. http://id.loc.gov/authorities/names/n80090239
Description
xiii, 474 pages : illustrations; 26 cm
Subjects
Note
  • Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
  • "A Wiley biomedical-health publication."
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0471790206
LCCN
74022483
Owning Institutions
Columbia University Libraries