Research Catalog

Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland / Maksymilian Pluta, Mariusz Szyjer, editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.

Title
Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland / Maksymilian Pluta, Mariusz Szyjer, editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.

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Details

Additional Authors
  • Institute of Applied Optics (Poland)
  • Komitet Badań Naukowych (Poland)
  • Pluta, Maksymilian.
  • Powichrowska, Ewa.
  • Society of Photo-optical Instrumentation Engineers.
  • Society of Photo-optical Instrumentation Engineers. Poland Chapter.
  • Szyjer, Mariusz.
Description
xx, 338 p. : ill.; 28 cm.
Series Statement
  • SPIE Poland Chapter proceedings ; 68
  • SPIE proceedings series ; v. 5064
Alternative Title
  • Lightmetry : metrology, spectroscopy, and testing techniques using light
  • Metrology and testing techniques using light
Subjects
ISBN
0819448702
Owning Institutions
Columbia University Libraries