Research Catalog

Title

Crystalline oxide-silicon heterostructures and oxide optoelectronics : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A. / editors, David Ginley ... [et al.].

Publication

Warrendale, Pa. : Materials Research Society, c2003.

Items in the Library & Off-site

Details

Additional Authors

• Ginley, D. S. (David S.)
• Materials Research Society
• Materials Research Society. Meeting (2002 : Boston, Mass.)
• Symposium on Crystalline Oxides on Semiconductors (2002 : Boston, Mass.)

Description

xv, 376 p. : ill.; 24 cm.

Series Statement

Materials Research Society symposium proceedings ; v. 747

Uniform Title

Materials Research Society symposia proceedings ; v. 747.

Alternative Title

Crystalline oxides on semiconductors

Subjects

• Epitaxy > Congresses
• Optoelectronics > Materials > Congresses
• Silicon > Congresses
• Semiconductor doping > Congresses
• Heterostructures > Congresses
• Semiconductors > Design and construction > Congresses

Note

• "This volume contains papers presented at Symposium T, "Crystalline Oxides on Semiconductors," held December 2-4 at the 2002 MRS Fall Meeting in Boston, Massachusetts."--p. xiii.

Bibliography (note)

• Includes bibliographical references and indexes.

Contents

• Engineering ZnO/GaN Interfaces for Tunneling Ohmic Contacts to GaN / E. Kaminska, A. Piotrowska, K. Golaszewska, R. Kruszka, A. Kuchuk, J. Szade, A. Winiarski, A. Barcz, J. Jasinski and Z. Liliental-Weber -- Heteroepitaxial Growth of a Wide Gap P-type Oxysulfide, LaCuOS / Hidenori Hiramatsu, Kazushige Ueda, Hiromichi Ohta, Masahiro Hirano and Hideo Hosono -- Growth and Characteristics of Single Crystals of Lithium Niobate / A. K. Batra, T. Gebre, J. Stephens, M. D. Aggarwal and R. B. Lal.
• Epitaxial Si Films Grown on Lattice Matched (La[subscript x]Y[subscript 1-x])O[subscript 3]/Si (111) Structures by Molecular Beam Epitaxy / V. Narayanan, S. Guha, N. A. Bojarczuk and M. Copel -- Role of the First Atomic Layers in Epitaxial Relationship and Interface Characteristics of SrTiO[subscript 3] Films on CeO[subscript 2]/YSZ/Si(001) / Tomoaki Yamada, Takanori Kiguchi, Naoki Wakiya, Kazuo Shinozaki and Nobuyasu Mizutani -- Sm Doping Effects on Electrical Properties of Sol-Gel Derived SrBi[subscript 2]Ta[subscript 2]O[subscript 9] Films / Eisuke Tokumitsu and Masahito Kishi -- MFIS and MFS Structures Using SrBi[subscript 2]Ta[subscript 2]O[subscript 9] Thin Films for the FRAM Applications / P. Victor, S. Bhattacharyya, S. Saha and S. B. Krupanidhi -- Progress in Epitaxial Oxides on Semiconductors / Z. Yu, Y. Liang, H. Li, J. Curless, C. Overgaard, R. Droopad, Y. Wei, X. Hu, B. Craigo, J. Finder, K. Eisenbeiser, A. Talin, S. Smith, S. Voight, J. Wang, D. Marshall, D. Jordan, J. Edwards, Jr. and K. Moore -- Epitaxial Growth and Magnetic Behavior of (Ni,Zn)Fe[subscript 2]O[subscript 4] Thin Films on Si Substrate Using Designed Buffer Layers for Novel Memory Application / Naoki Wakiya, Kazuo Shinozaki and Nobuyasu Mizutani -- Growth, Structure, and Properties of Uniformly a-Axis Oriented Ferroelectric Bi[subscript 3.25]La[subscript 0.75]Ti[subscript 3]O[subscript 12] Thin Films on Si(100) Substrates / D. Hesse, H. N. Lee, N. D. Zakharov and U. Gosele -- Recent Progress in Ferroelectic-Gate FETs / Hiroshi Ishiwara and Byung-Eun Park -- Integration Processes and Properties of One Transistor Memory Devices / Tingkai Li, Sheng Teng Hsu, Bruce Ulrich, Fengyan Zhang and Dave Evans -- X-ray Photoelectron and UV Photoyield Spectroscopic Studies on Structural and Electronic Properties of Sr[subscript x]Bi[subscript y]Ta[subscript 2]O[subscript 9] Films / Mitsue Takahashi, Minoru Noda and Masanori Okuyama -- First Principles Modeling of High-k Dielectric Materials / Gyuchang Jun and Kyeongjae Cho -- First-Principles Study of Electronic and Dielectric Properties of ZrO[subscript 2] and HfO[subscript 2] / Xinyuan Zhao and David Vanderbilt -- Atomic Structure, Band Offsets and Hydrogen in High-k Oxide:Silicon Interfaces / J. Robertson and P. W. Peacock -- Oxygen Vacancy Defects in Tantalum Pentoxide: A Density Functional Study / R. Ramprasad, Michael Sadd, Doug Roberts, Tom Remmel, Mark Raymond, Eric Luckowski, Sriram Kalpat, Carole Barron and Mel Miller -- High-k Gate Dielectrics for Si and Compound Semiconductors by Molecular Beam Epitaxy / J. Raynien Kwo and Minghwei Hong -- Physical and Electrical Characterization of Hafnium Silicate Thin Films / Patrick S. Lysaght, Brendan Foran, Gennadi Bersuker, Larry Larson, Robert W. Murto and Howard R. Huff -- Dynamic Growth Mechanism and Interface Structure of Crystalline Zirconia on Silicon / S. J. Wang, A. C. H. Huan and C. K. Ong -- The Influence of Defects on Compatibility and Yield of the HfO[subscript 2]-PolySilicon Gate Stack for CMOS Integration / V. S. Kaushik, S. DeGendt, R. Carter, M. Claes, E. Rohr, L. Pantisano, J. Kluth, A. Kerber, V. Cosnier, E. Cartier, W. Tsai, E. Young, M. Green, J. Chen, S.-A. Jang, S. Lin, A. Delabie, S. V. Elshocht, Y. Manabe, O. Richard, C. Zhao, H. Bender, M. Caymax and M. Heyns -- Improvement of Capacitance-Voltage (C-V) Characteristics of YSZ/Si(001) and ZrO[subscript 2]/Si Thin Film by Nb-Doping / Naoki Wakiya, Tomohiko Moriya, Kazuo Shinozaki and Nobuyasu Mizutani -- A Study of Al[subscript 2]O[subscript 3]:C Films on Si(100) Grown by Low Pressure MOCVD / M. P. Singh, C. S. Thakur, N. Bhat and S. A. Shivashankar -- Conduction Mechanisms in SrTiO[subscript 3] Thin Films on Silicon / Bogdan Mereu, George Sarau and Marin Alexe -- HRTEM Investigation of Effect of Various Rare Earth Oxide Dopants on Epitaxial Zirconia High-k Gate Dielectrics / Takanori Kiguchi, Naoki Wakiya, Kazuo Shinozaki and Nobuyasu Mizutani -- Structural Quality and Electrical Behavior of Epitaxial High-k Y[subscript 2]O[subscript 3]/Si(001) / G. Vellianitis, G. Apostolopoulos, A. Dimoulas, K. Argyropoulos, B. Mereu, R. Scholz, M. Alexe and J. C. Hooker -- Study of Interface Formation of (Ba,Sr)TiO[subscript 3] Thin Films Grown by rf Sputter Deposition on Bare Si and Thermal SiO[subscript 2]/Si Substrates / N. A. Suvorova, A. H. Mueller, A. A. Suvorova, M. Saunders and E. A. Irene -- The Behavior of Cyclic Voltammetry Stripping (CVs) With Tin-Doped Indium Oxide in 0.3M Hydrochloric Acid / K. C. Li, C. A. Huang, G. C. Tu and W. S. Wang -- Electro-Structural and Film Growth Properties of Room-Temperature Deposited Indium-Tin-Oxide on Polymer Substrates / Sung Kyu Park, Jeong In Han, Dae Gyu Moon, Won Keun Kim and Min Gi Kwak -- Thin-Film Indium Oxide Doped With Refractory Metals / Yuki Yoshida, Chollada Warmsingh, Timothy A. Gessert, John D. Perkins, David S. Ginley and Timothy J. Coutts -- An Angular Dependent X-Ray Photoemission Study of Indium-Tin-Oxide Surfaces / H. H. Fong, W. J. Song and S. K. So -- Wide-Gap P-Type Conductive Properties in Layered Oxychalcogenides / Kazushige Ueda, Kouhei Takafuji, Hidenori Hiramatsu, Hiromichi Ohta, Masahiro Hirano, Hideo Hosono and Hiroshi Kawazoe -- X-ray Amorphous P-Type Conductive Oxide; ZnRh[subscript 2]O[subscript 4] / Satoru Narushima, Hiroshi Mizoguchi, Hiromichi Ohta, Masahiro Hirano, Ken-ichi Shimizu, Kazushige Ueda, Toshio Kamiya and Hideo Hosono -- Co-Doping Deposition of p-Type ZnO Thin Films Using KrF Excimer Laser Ablation / Kenji Ebihara, Tamiko Ohshima, Tomoaki Ikegami, Jes Asumussen and Raj K. Thareja -- Photo-Induced Insulator-Semiconductor Transition in 12CaO.7Al[subscript 2]O[subscript 3] (CI2A7) / Katsuro Hayashi, Satoru Matsuishi, Toshio Kamiya, Masahiro Hirano and Hideo Hosono -- Reactive Solid-Phase Epitaxy - A Novel Growth Method for Single-Crystalline Thin Films of Complex Oxides With Superlattice Structure / H. Ohta, K. Nomura, H. Hiramatsu, T. Suzuki, K. Ueda, M. Orita, M. Hirano, Y. Ikuhara and H. Hosono -- Fabrication of MISFET Exhibiting Normally-Off Characteristics Using a Single-Crystalline InGaO[subscript 3](ZnO)[subscript 5] Thin Film / K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano and H. Hosono -- Materials Selection for SrTiO[subscript 3]-Based Epitaxial Oxide Field-Effect Devices / K. Shibuya, T. Ohnishi, M. Kawasaki, H. Koinuma and M. Lippmaa -- Photoemission Study of Interfacial Oxidation in ZrO[subscript 2]/Subnanometer SiON[subscript x]/Si(100) Stacked Structures / Seiichi Miyazaki, Hiroki Yamashita, Hiroshi Nakagawa and Masanori Yamaoka -- Ferroelectric Field Effect Device / A. G. Schrott, J. A. Misewich, R. Ramesh and V. Nagarajan -- The Interactions Between SBT and Transition Metal Studied by DV-X[alpha] Method / Hanxing Liu, Xiamin Min, Xiaoqin Sun, Jing Xiao and Shixi Ouyang -- A Comparison of Tunneling Through Thin Oxide Layers on Step-Free and Normal Si Surfaces / Antonio C. Oliver and Jack M. Blakely -- Recent Development of Al[subscript 2]O[subscript 3]-Based Gas-Sensing Materials / P. Yu, D. Q. Xiao, Y. Pan, P. Li, Z. H. Yang and J. G. Zhu -- Stability of Indium Tin Oxide/Polymer Interfaces / X. Crispin, A. Crispin, M. P. de Jong, S. Marciniak, W. Osikowicz, S. Jonsson, M. Fahlman, Th. Kugler, L. J. van Ijzendoorn, M. J. A. de Voigt and W. R. Salaneck -- Experimental and Theoretical Studies of the Si(100)/SiO[subscript 2] Interface Formed by Wet and Dry Oxidation / A. Roy Chowdhuri, Dong-Un Jin and C. G. Takoudis -- SiO[subscript 2] Formation at the Aluminum Oxide/Si(100) Interface / A. Roy Chowdhuri, C. G. Takoudis, R. F. Klie and N. D. Browning -- Role of Ambience on the Diffusion of Charge Carriers in the TiO[subscript 2] Layers Investigated by the Photovoltage Technique / V. Duzhko, J. Rappich and Th. Dittrich -- A Structural Study of the Amorphous to Crystalline Transformation in In[subscript 2]O[subscript 3] Thin Films / Burag Yaglioglu, Hyo-Young Yeom, Eric Chason and David C. Paine --

ISBN

1558996842

OCLC

• ocm52836782
• SCSB-4817545

Owning Institutions

Columbia University Libraries