Research Catalog

Memory technology, design and testing : records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing : 28-29 July, 2003, San Jose, California / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.

Title
Memory technology, design and testing : records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing : 28-29 July, 2003, San Jose, California / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.
Author
IEEE International Workshop on Memory Technology, Design, and Testing (11th : 2003 : San Jose, Calif.)

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Details

Additional Authors
  • IEEE Computer Society.
  • IEEE Computer Society. Technical Committee on VLSI.
  • IEEE Computer Society. Technical Council on Test Technology.
  • IEEE Solid-State Circuits Society.
Description
ix, 95 p. : ill.; 28 cm.
Alternative Title
MTDT 2003
Subject
  • Random access memory > Congresses
  • Semiconductor storage devices > Testing > Congresses
ISBN
0769520049
Owning Institutions
Columbia University Libraries