Research Catalog

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts / sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC).

Title
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts / sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC).
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (18th : 2003 : Boston, Mass.)

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Details

Additional Authors
  • IEEE Computer Society. Fault-Tolerant Computing Technical Committee.
  • IEEE Computer Society. Test Technology Technical Committee.
Description
xii, 607 p. : ill.; 23 cm.
Alternative Title
  • DFT 2003
  • Defect and fault tolerance in VLSI systems
  • International Symposium on Defect and Fault Tolerance in VLSI Systems
Subjects
ISBN
0769520421
Owning Institutions
Columbia University Libraries