Research Catalog

X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California

Title
X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester [and others].
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1986], ©1986.

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Details

Additional Authors
  • Rusch, Thomas William.
  • University of Rochester. Institute of Optics.
Description
vi, 156 pages : illustrations; 28 cm.
Series Statement
Proceedings of SPIE--the International Society for Optical Engineering ; v. 690
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 690.
Subject
  • X-rays > Industrial applications > Congresses
  • X-ray spectroscopy > Congresses
  • X-rays > Diffraction > Congresses
  • Materials > Analysis > Congresses
Bibliography (note)
  • Includes bibliographies and index.
ISBN
0892527250
LCCN
86061937
OCLC
  • 14440196
  • ocm14440196
Owning Institutions
Columbia University Libraries