Research Catalog
Wave-optical systems engineering II : 3-4 August, 2003, San Diego, USA / Frank Wyrowski, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Title
- Wave-optical systems engineering II : 3-4 August, 2003, San Diego, USA / Frank Wyrowski, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Publication
- Bellingham, Wash. : SPIE, [2003], ©2003.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TA1660 .W375 2003g | Off-site |
Details
- Additional Authors
- Description
- vii, 274 pages : illustrations; 28 cm.
- Series Statement
- SPIE proceedings series, 0277-786X ; v. 5182
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 5182.
- Alternative Title
- Wave optical systems engineering II
- Wave-optical systems engineering 2
- Wave-optical systems engineering two
- Subject
- Bibliography (note)
- Includes bibliographical references and author index.
- Contents
- Comments on wave-optical engineering / F. Wyrowski, H. Schimmel and S. Buhling -- Use of ray tracing in wave-optical engineering / H. Schimmel, S. Buhling and F. Wyrowski -- Local spherical interface approximation in the analysis of field propagation through modulated interfaces / H. Lajunen, J. Tervo, T. Vallius, J. Turunen and F. Wyrowski -- Wave-optical engineering with VOL4 VirtualLab / S. Buhling, H. Schimmel and F. Wyrowski -- Wigner optics and wave optics: fundamentals and practical applications / J. T. Sheridan, B. Hennelly and D. Kelly -- Optical vortex trajectories through paraxial modal analysis / F. S. Roux -- Propagation of electromagnetic fields between nonparallel planes / K. Matsushima, H. Schimmel, S. Buhling and F. Wyrowski -- Wave-optical considerations in photolithography / A. K. Wong and C. Pierrat -- Lithographic image simulation for the 21st century with 19th-century tools / R. L. Gordon and A. E. Rosenbluth -- Mask and source optimization for lithographic imaging systems / A. Erdmann, R. Farkas, T. Fuhner, B. Tollkuhn and G. Kokai -- Optimized visualization of phase objects with semiderivative real filters / A. Sagan, M. Kowalczyk and T. Szoplik -- Point spread function engineering in confocal scanning microscopy / M. Martinez-Corral -- Challenges in industrial applications of diffractive beam splitting / S. Buhling, H. Schimmel and F. Wyrowski -- Polarization modulation by subwavelength-structured space-variant dielectric interfaces / J. Tervo and J. Turunen -- Investigation of multimode dispersionless beams / V. S. Pavelyev, V. A. Soifer, M. R. Duparre and B. Luedge -- Scaled optical Fourier transform: practical limitations / D. Kelly, J. T. Sheridan and W. T. Rhodes -- Laser-mode engineering by generalized resonator concepts / U. D. Zeitner -- Intracavity beamshaping in waveguide lasers / A. Buettner and U. D. Zeitner -- Design for shaping, splitting, and diffusing light: a comparison / F. Wyrowski, H. Schimmel and S. Buhling -- Wave-optical components for reconfigurable short-distance optical interconnects / L. Desmet, R. Buczynski, W. Grabowski, J. Van Erps, M. Vervaeke and H. Thienpont -- Optical wave engineering for nanoscale surface metrology / J. Shamir, B. Spektor and Y. Parkhomenko -- Optical scanning cryptography / T.-C. Poon -- Design and experiments of planar optical light guides for virtual image displays / I. Gurwich, V. Weiss, L. Eisen, M. Meyklyar and A. A. Friesem -- Diamond DOEs for focusing IR laser beams into pregiven focal domains / V. S. Pavelyev, V. A. Soifer, D. L. Golovashkin, V. V. Kononenko, V. I. Konov, S. M. Pimenov, M. R. Duparre and B. Luedge -- Design and optimization considerations of multifocus phase-only diffractive elements / M. Skeren, I. Richter and P. Fiala -- High-order Bessel beam generation using a Mach-Zehnder Interferometer / J. C. Gutierrez-Vega, C. Lopez-Mariscal and S. Chavez-Cerda -- Phase diffractive filter to analyze an output step-index fiber beam / S. N. Khonina, R. V. Skidanov, V. V. Kotiyar, K. Jefimovs and J. Turunen -- Characterization of thin films nonuniform in optical parameters by spectroscopic digital reflectometry / I. Ohlidal, M. Ohlidal, P. Klapetek, V. Cudek and M. Jakl.
- ISBN
- 0819450553
- Owning Institutions
- Columbia University Libraries