Research Catalog
Intrinsic point defects, impurities, and their diffusion in silicon
- Title
- Intrinsic point defects, impurities, and their diffusion in silicon / Peter Pichler.
- Author
- Pichler, P. (Peter)
- Publication
- Wien ; New York : Springer, [2004], ©2004.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | TK7871.15.S55 P53 2004g | Off-site |
Holdings
Details
- Description
- xxi, 554 pages : illustrations; 25 cm.
- Series Statement
- Computational microelectronics, 0179-0307
- Uniform Title
- Computational microelectronics.
- Subjects
- ISBN
- 3211206876 (hd.bd.)
- OCLC
- ocm55963103
- SCSB-5072365
- Owning Institutions
- Columbia University Libraries