Research Catalog

Advances in thin film coatings for optical applications : 4-5 August, 2004, Denver, Colorado, USA

Title
Advances in thin film coatings for optical applications : 4-5 August, 2004, Denver, Colorado, USA / Jennifer D.T. Kruschwitz, James B. Oliver, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash. : SPIE, [2004], ©2004.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance TS517.2 .A387 2004gOff-site

Holdings

Details

Additional Authors
  • Kruschwitz, Jennifer D. T.
  • Oliver, James B.
  • Society of Photo-optical Instrumentation Engineers.
Description
vii, 160 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 5527
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5527.
Alternative Title
Thin film coatings for optical applications
Subjects
Bibliography (note)
  • Includes bibliographical references and author index.
Contents
Computer-assisted manual coating design approach / W. H. Southwell -- Exact synthesis of dielectric thin film filters / A. Rowinska-Schwarzweller and N. Fruehauf -- Anomalous phase in one-dimensional multilayer periodical structures with birefringent materials / A. Mandatori, C. Sibilia, M. Bertolotti, S. Zhukovsky, J. W. Haus and M. Scalora -- Optical coatings for gravitational wave detection / G. M. Harry, H. Armandula, E. Black, D. R. M. Crooks, G. Cagnoli, M. M. Fejer, J. Hough, S. D. Penn, S. Rowan, R. Route and P. Sneddon -- Thermal fields in multimode laser-metallic thin film interaction / M. Oane, I. G. Morjan and R. V. Medianu -- Ion-assist applications of broad-beam ion sources / H. R. Kaufman and J. M. E. Harper -- Developments in energetic processes for optical coating applications / M. L. Futton -- High-performance antireflection coatings for telecommunications / I. C. Stevenson -- Investigation of damage threshold of ion beam deposited oxide thin optics for high-peak-power start-pulse lasers / A. M. Fitzgerald Dummer, F. Brizuela, C. Duskis, B. Luther, M. Lorotonda, J. J. Rocca, J. George, S. Kohli, P. McCurdy and C. S. Menoni -- High-temperature film thickness sensors for CVD process control / S. F. Grimshaw -- Study on adhesion of thin film coatings of polypyrrole on glass substrate for mechanical durability of sensor devices / L. Bansal and M. El-Sherif -- Characterization of C[subscript 70] doped poly(styrene)-b- poly(hexyl methacrylate) (PS-PHMA) thin film on c-SI substrate with a Jobin Yvon UVISEL phase-modulated spectroscopic ellipsometer (PMSE) / A. R. Kramer, Jobin Yvon, N. Yao and V. Pelletier -- Chalcogenide-based system and its thin films for phase change optical data storage / Y. D. Sharma and P. K. Bhatnagar -- Study of the oxidation of ns-SiN[subscript x]:H thin films using FTIR phase modulated ellipsometry / J. Sancho-Parramon, S. Bosch, A. Pinyol, E. Bertran and A. Canillas -- Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O / I. Ohlidal, M. Ohlidal, D. Franta, V. Cudek, V. Bursikova and M. Siler -- Design of reflection-retarders using non-negative film-substrate systems / A. R. M. Zaghloul and J. S. Mason.
ISBN
0819454656
OCLC
  • ocm56777526
  • SCSB-5084995
Owning Institutions
Columbia University Libraries