Research Catalog
Digest of papers, ... Test Conference.
- Title
- Digest of papers, ... Test Conference.
- Author
- Test Conference.
- Publication
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : Available from IEEE Computer Society Publications Office, ©1979-1980.
Items in the Library & Off-site
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2 Items
| Status | Vol/Date | Format | Access | Call Number | Item Location |
|---|---|---|---|---|---|
| (1979) | Text | Request in advance | TK7874 .S431 (1979) | Off-site | |
| (1980) | Text | Request in advance | TK7874 .S431 (1980) | Off-site |
Holdings
Details
- Additional Authors
- IEEE Computer Society. Test Technology Committee.
- Publication Date
- 1979-1980.
- Description
- 2 volumes : illustrations; 28 cm
- Alternative Title
- IEEE ... Semiconductor Test Conference
- Subject
- Note
- Vols. have also distinctive titles.
- Bibliography (note)
- Includes bibliographical references and index.
- Issued By (note)
- Sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- LCCN
- 80083501
- OCLC
- 7201481
- ocm07201481
- SCSB-2532762
- Owning Institutions
- Columbia University Libraries