Research Catalog
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends
- Title
- Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner.
- Author
- Benninghoven, A.
- Publication
- New York : J. Wiley, 1987.
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | QD96.S43 B46 1987 | Off-site |
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Details
- Additional Authors
- Description
- xxxv, 1227 pages : illustrations; 24 cm.
- Series Statement
- Chemical analysis ; v. 86
- Uniform Title
- Chemical analysis ; v. 86.
- Subject
- Secondary ion mass spectrometry
- Note
- "A Wiley-Interscience publication."
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0471010561
- LCCN
- 86011014
- OCLC
- 13525968
- ocm13525968
- Owning Institutions
- Columbia University Libraries