Research Catalog

Title

Electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure : symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A. / editors: David C. Martin [and others].

Author

Symposium on Electron Microscopy of Molecular and Atom-Scale Behavior, Chemistry and Structure (2004 : Boston, Mass.)

Publication

Warrendale, Pa. : Materials Research Society, [2005], ©2005.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Martin, David C.
• Materials Research Society. Fall Meeting (2004 : Boston, Mass.)

Description

ix, 204 pages : illustrations; 24 cm.

Series Statement

Materials Research Society symposium proceedings ; vol. 839

Uniform Title

Materials Research Society symposia proceedings ; v. 839.

Subjects

• Electron microscopy > Congresses
• Materials > Microscopy > Congresses
• Nanostructured materials > Congresses

Note

• "These papers were presented at Symposium P, 'Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure,' held November 29-December 1 at the 2004 MRS Fall Meeting in Boston, Massachusetts."--Pref.

Bibliography (note)

• Includes bibliographical references and indexes.

Contents

Tomographic imaging of nanocrystals by aberration-corrected scanning transmission electron microscopy / Klaus van Benthem, Yiping Peng and Stephen J. Pennycook -- Materials analysis by aberration-corrected STEM / Ondrej L. Krivanek, Neil J. Bacon, George C. Corbin, Niklas Dellby, Andrew McManama-Smith, Matthew F. Murfitt, Peter D. Nellist and Zoltan S. Szilagyi -- Surface chemistry of combustion-synthesized iron oxide nanoparticles determined by electron energy-loss spectroscopy / V. J. Leppert, K. E. Pinkerton and J. Jasinski -- High-resolution interface atomic structure analysis in silicon nitride ceramics / A. Ziegler, J. C. Idrobo, M. K. Cinibulk, C. Kisielowski, N. D. Browning and R. O. Ritchie -- In situ quantitative plasmon spectroscopic determination and imaging of multiple solid-state properties at the nanoscale : a new capability for material research / Vladimir P. Oleshko and James M. Howe -- Simulations of the electrostatic potential in a thin silicon specimen containing a p-n junction / P. K. Somodi, R. E. Dunin-Borkowski, A. C. Twitchett, C. H. W. Barnes and P. A. Midgley -- Electron holographic characterization of nano-hetero interface effect in gold catalysts / S. Ichikawa, T. Akita, K. Okazaki, K. Tanaka and M. Kohyama -- The electron microscopy and XRD investigation of structure processes in CMR crystals LaMnO[subscript 3+[delta]] / V. Sh. Shekhtman, V. Sedykh, N. S. Afonikova, A. V. Dubovitskii and V. I. Kulakov -- Effect of simulated body fluid on the microstructure of ferrimagnetic bioglass-ceramics / N. I. Papanearchou, Th. Leventouri, A. C. Kis, A. Hotiu and I. M. Anderson -- The features of investigations and observations of nanoamorphous metals and nanocrystalline oxides on electron microscope / R. Malkhasyan, R. Karakhanyan, M. Nazaryan, A. Khachatryan and A. Markosyan -- Transmission electron microscopy study of domain structures in ferroelectric SrBi[subscript 2]Nb[subscript 2]O[subscript 9] ceramics / C. Karthik, N. Ravishankar and K. B. R. Varma -- HREM imaging of screw dislocation core structures in bcc metals / B. G. Mendis, Y. Mishin, C. S. Hartley and K. J. Hemker -- On the effect of local grain-boundary chemistry on the macroscopic mechanical properties of a high purity Y[subscript 2]O[subscript 3]-Al[subscript 2]O[subscript 3]-containing silicon nitride ceramic / A. Ziegler, J. M. McNaney, M. J. Hoffmann and R. O. Ritchie -- Surface engineering of SrTiO[subscript 3] (111) substrates for the epitaxial growth of BLT films / Ju Hyung Suh, Yong Seok Lee and Chan-Gyung Park -- Towards 3D image-based nanocrystallography by means of transmission electron goniometry / Peter Moeck, Wentao Qin and Philip B. Fraundorf -- Discrete tomography of Ga and InGa particles from HREM image simulation and exit wave reconstruction / J. R. Jinschek, H. A. Calderon, K. J. Batenburg, V. Radmilovic and Ch. Kisielowski -- Novel approaches for the characterization of electromagnetic fields using electron holography / Takeshi Kasama, Yanna Antypas, Ryan K. K. Chong and Rafal E. Dunin-Borkowski -- Electron holography as a tool for dopant profile characterization of semiconductor devices / Takao Matsumoto and Masanari Kouguchi -- Stress relaxation and medium-range order in diamond-like amorphous carbon films / Xidong Chen, John Sullivan, Tom Friedmann and Dean Miller -- Accurate determination of orientation relationships between ferroelastic domains : the tetragonal to monoclinic transition in LaNbO[subscript 4] as an example / O. Prytz and J. Tafto -- Suzuki segregation to stacking faults in a Cu-Si alloy / B. G. Mendis, I. P. Jones and R. E. Smallman -- Mapping the structure of a hydrated polymer blend using energy-loss spectroscopy in the cryo-STEM / Alioscka Sousa, Abdelaziz Aitouchen and Matthew Libera -- Synthesis and microstructures of [alpha]-Fe[subscript 2]O[subscript 3] bicrystalline nanowires / R. M. Wang, Y. F. Chen, Y. Y. Fu, H. Zhang and C. Kisielowski -- Electron microscopy analysis of the central dark line defect of the human tooth enamel / A. G. Rodriguez-Hernandez, M. E. Fernandez, G. Carbajal-De-La-Torre, R. Garcia-Garcia and J. Reyes-Gasga -- Electron microscopy of the operation of nanoscale devices / John Cumings, David Goldhaber-Gordon, A. Zettl, M. R. McCartney and J. C. H. Spence -- In situ transmission electron microscopy of nano-sized metal clusters / Jeff Th. M. De Hosson, George Palasantzas, Tomas Vystavel and Siete Koch -- In situ electron microscopy studies of the effect of solute segregation on grain boundary anisotropy and mobility in an Al-Zr alloy / Mitra L. Taheri, Eric Stach, Velimir Radmilovic, Hasso Weiland and Anthony D. Rollett -- In situ HREM study on the thermal stability of atomic layer epitaxy grown InAs/GaAs quantum dots / H. S. Kim, J. H. Suh, C. G. Park, S. J. Lee, S. K. Noh, J. D. Song, Y. J. Park, W. J. Choi and J. I. Lee.

ISBN

1558997873

OCLC

• ocm60811026
• SCSB-5205072

Owning Institutions

Columbia University Libraries