Research Catalog
Breakdown phenomena in semiconductors and semiconductor devices
- Title
- Breakdown phenomena in semiconductors and semiconductor devices / Michael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.
- Author
- Levinshteĭn, M. E. (Mikhail Efimovich)
- Publication
- New Jersey ; London : World Scientific, [2005], ©2005.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | QC711.8.B7 L49 2005g | Off-site |
Holdings
Details
- Additional Authors
- Description
- xiii, 208 pages : illustrations; 26 cm.
- Summary
- "The aim of this book is to summarize the main experimental results on avalanche and breakdown phenomena in semiconductors and semiconductor devices and to analyze their features from a unified point of view. Attention is focused on the phenomenology of avalanche multiplication and the various kinds of breakdown phenomena and their qualitative analysis."--BOOK JACKET.
- Series Statement
- Selected topics in electronics and systems ; v. 36
- Uniform Title
- Selected topics in electronics and systems ; v. 36.
- Subjects
- Bibliography (note)
- Includes bibliographical references (p. 185-194) and indexes.
- Contents
- 1. Introductory chapter -- 2. Avalanche multiplication -- 3. Static avalanche breakdown -- 4. Avalanche injection -- 5. Dynamic breakdown.
- ISBN
- 9812563954
- OCLC
- ocm62473250
- SCSB-5217585
- Owning Institutions
- Columbia University Libraries