Research Catalog

Reflection electron microscopy and spectroscopy for surface analysis

Title
Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang.
Author
Wang, Zhong Lin.
Publication
Cambridge ; New York : Cambridge University Press, [1996], ©1996.
Supplementary Content
Publisher description

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2 Items

StatusFormatAccessCall NumberItem Location
TextRequest in advance TA417.23 .W36 1996Off-site
TextUse in library Off-site

Holdings

Details

Description
xix, 436 pages : illustrations; 26 cm
Subjects
Bibliography (note)
  • Includes bibliographical references (p. 419-430) and indexes.
ISBN
  • 0521482666 (hbk.)
  • 0521017955 (pbk.)
LCCN
95033552
OCLC
  • ocm33078848
  • SCSB-5226582
Owning Institutions
Columbia University Libraries