Research Catalog

Title

Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.

Author

Foster, A. (Adam Stuart), 1975-

Publication

New York : Springer Science+Business, [2006], ©2006.

Items in the Library & Off-site

Holdings

Details

Additional Authors

Hofer, Werner, 1960-

Description

xiv, 281 pages : illustrations; 25 cm.

Summary

"Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in a tutorial style, the book explains from the ground up the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The authors provide the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how materials properties influence the instrument's operation, and theorists will understood how simulations can be directly compared to experimental data."--BOOK JACKET.

Series Statement

Nanoscience and technology

Uniform Title

Nanoscience and technology.

Subject

• Scanning probe microscopy

Bibliography (note)

• Includes bibliographical references and index.

Contents

1. The physics of scanning probe microscopes -- 2. SPM : the instrument -- 3. Theory of forces -- 4. Electron transport theory -- 5. Transport in the low conductance regime -- 6. Bringing theory to experiment in SFM -- 7. Topographic images -- 8. Single-molecule chemistry -- 9. Current and force spectroscopy -- 10. Outlook.

ISBN

0387400907

LCCN

• 2005936713
• 9780387400907

OCLC

• ocm70900496
• SCSB-5269348

Owning Institutions

Columbia University Libraries