Research Catalog

Title

Emerging nanotechnologies : test, defect tolerance, and reliability / Mohammad Tehranipoor, editor.

Publication

New York : Springer Verlag, [2008], ©2008.

Items in the Library & Off-site

Holdings

Details

Additional Authors

Tehranipoor, Mohammad H., 1974-

Description

xii, 405 pages : illustrations; 24 cm.

Series Statement

Frontiers in electronic testing ; 37

Uniform Title

Frontiers in electronic testing ; 37.

Subjects

• Microtechnology
• Nanotechnology

Bibliography (note)

• Includes bibliographical references and index.

Contents

Section 1. Test and Defect Tolerance for Crossbar-Based Architectures / M. Tehranipoor -- Chapter 1. Defect-Tolerant Logic with Nanoscale Crossbar Circuits / T. Hogg and G. Snider -- Chapter 2. Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics / Z. Wang and K. Chakrabarty -- Chapter 3. Test and Defect Tolerance for Reconfigurable Nanoscale Devices / M. Tehranipoor and R. Rad -- Chapter 4. A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology / J.G. Brown and R.D. (Shawn) Blanton -- Chapter 5. Defect Tolerance in Crossbar Array Nano-Architectures / M.B. Tahoori -- Section 2. Test and Defect Tolerance for QCA Circuits / M. Tehranipoor -- Chapter 6. Reversible and Testable Circuits for Molecular QCA Design / X. Ma, J. Huang, C. Metra and F. Lombardi -- Chapter 7. Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems / J. Di and P.K. Lala -- Chapter 8. QCA Circuits for Robust Coplanar Crossing / S. Bhanja, M. Ottavi, S. Pontarelli and F. Lombardi -- Chapter 9. Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata / M. Liu and C.S. Lent -- Section 3. Testing Microfluidic Biochips / M. Tehranipoor -- Chapter 10. Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems / F. Su, S. Ozev and K. Chakrabarty -- Chapter 11. Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips / F. Su, W. Hwang, A. Mukherjee and K. Chakrabarty -- Section 4. Reliability for Nanotechnology Devices / M. Tehranipoor -- Chapter 12. Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields / K. Nepal, R.I. Bahar, J. Mundy, W.R. Patterson and A. Zaslavsky -- Chapter 13. Towards Nanoelectronics Processor Architectures / W. Rao, A. Orailoglu and R. Karri -- Chapter 14. Design and Analysis of Fault-Tolerant Molecular Computing Systems / D. Bhaduri, S.K. Shukla, H. Quinn, P. Graham and M. Gokhale.

ISBN

• 9780387747460
• 038774746X

LCCN

2007933699

OCLC

• ocn183259606
• 183259606
• SCSB-5394933

Owning Institutions

Columbia University Libraries